Advanced afm investigations of model molecular systems




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НазваниеAdvanced afm investigations of model molecular systems
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Advanced AFM investigations of model molecular systems

for organic electronics


B. Grévin1*, R. Demadrille1, Y. Luo1, P. Rannou1

1 UMR5819-SPrAM (CEA-CNRS-UJF) CEA-Grenoble INAC/SPrAM/LEMOH, 17 rue des Martyrs 38054 Grenoble cedex 9, France.

*benjamin.grevin@cea.fr


M. Linares2, R. Lazzaroni2, Ph. Leclère2

2 Service de Chimie des Matériaux Nouveaux, Université de Mons-Hainaut, Place du Parc, 20 B-7000 Mons.


Nowadays, near field microscopy techniques are essential tools for fundamental and technological research in the field of organic and molecular electronics. A thorough knowledge of the molecular conformation, self-organization and electronic properties on surfaces is indeed mandatory for the optimization of electronic and optoelectronic devices with smart functionalities.

This past decade, Atomic Force Microscopy (AFM) techniques have been widely applied in ambient conditions (amplitude modulation AFM, also called intermittent contact AFM) to characterize the microscopic morphology of a tremendous amount of π -conjugated oligomers and polymers deposited in thin films on conducting and insulating surfaces [1], such as dielectrics used for the gate in OFETs. Particularly, the fibrillar organization of solution processed edge-on supramolecular stacks, yielding high mobilities in OFETs, has been investigated and reported by many groups [1-3]. Following these research, it is now widely agreed that these edge-on molecular assemblies are mandatory to achieve high carrier mobilities under field effect doping. Besides, the potentiometric and electrostatic modes of AFM have also been used for local investigations of the electronic transport properties in thin-film based OFETs [4-5], and to probe the photo-generation of charge carriers in donor-acceptor polymer blends [6-7]. However, despite a tremendous number of AFM studies, the exact nature of the molecular packing within the assemblies remains often unknown, due to the limits in spatial resolution of AFM in the amplitude modulation mode. Intermittent contact images revealed the fibrillar organization of the stacks but with no real supramolecular resolution. Non-contact AFM (NC-AFM) under ultra-high vacuum (UHV) in the frequency modulation mode (FM-AFM), which provides a higher resolution [8] than intermittent contact AFM, appears henceforth as a new promising technique.

In this context, we show that NC-AFM can provide information with unprecedented resolution on the molecular conformation within functional supra-molecular stacks self-assembled from solution. The nature of the molecular conformations within thiophene-fluorenone oligomer self-assemblies, is discussed in terms of topographic and spectroscopic (i.e. dissipation images) images, supported by theoretical modeling.

In a second part, it is shown that scanning Kelvin probe microscopy (SKPM), an AFM-based potentiometric technique, allows for an in-depth exploration of the local electrical potential at the organic/dielectric interface in sub-μm thick organic single crystals (OSCs), opening novel perspectives for a deeper understanding of intrinsic charge transport, interfacial and contact effects in semi-conducting organic single crystals [9].


[1] Ph. Leclère et al., Materials Science and Engineering R55, 1 (2006)

[2] R.J. Kline et al., Adv. Mater. 15, 1519 (2003)

[3] B.S. Ong et al., Adv. Mater. 17, 1141 (2005)

[4] L. Bürgi, H. Sirringhaus, R. H. Friend, Appl. Phys. Lett. 80, 2913 (2002)

[5] K. P. Puntambekar, P. V. Pesavento, C. D. Frisbie, Appl. Phys. Lett. 83, 5539 (2003)

[6] A. Liscio et al., J. Am. Chem. Soc. 130, 781 (2008)

[7] V. Palermo et al., Adv. Funct. Mater. 17, 472 (2007)

[8] F.J. Giessibl Rev. Mod. Phys. 75, 949 (2003)

[9] Y. Luo et al., Adv. Mater. 19, 2267 (2007)





B. Grévin

Chargé de Recherche au CNRS


Private Address: 52 impasse des Châtaigniers

38470 Vinay - FRANCE

Professional Address: UMR5819 SPrAM CEA-CNRS-UJF

CEA-Grenoble INAC/SPrAM/LEMOH

17 rue des Martyrs 38054 Grenoble cedex 9

FRANCE

Phone : + 33 (0)4 38 78 46 15

Fax : + 33 (0)4 38 78 51 13

E-mail: benjamin.grevin@cea.fr


Benjamin Grevin (born in 1970 in France) studied physics at the Institut National Polytechnique de Grenoble (INPG) where he received his Engineer diploma, and also obtained a Master Science degree in physics at the University Joseph Fourier Grenoble I. He performed his Ph.D. at the Laboratoire de Spectrométrie Physique of University Joseph Fourier Grenoble I under the supervision of Dr. Yves Berthier; working on NMR investigations of cuprates superconductors. From 1998–2000 he worked on STM investigations of manganites thin films, as a postdoctoral research fellow at the Département de Physique de la Matière Condensée (DPMC) of University of Geneva, in the group leaded by Prof. Ø. Fischer. Since the end of 2000, he is working within UMR5819-SPrAM (CEA-CNRS-UJF) as Chargé de Recherche au CNRS. His current research is focused on the use of scanning probe microscopy techniques (STM/STS, AFM/SKPM) for local investigations of model molecular and macromolecular pi-conjugated self-assemblies and operating organic devices. His work has been awarded the bronze medal of CNRS (2005).

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